Events | < 1 minute Reading Time | 2023-01-08

Automotive Testing Expo India 2023

The path to reduced product development cycles, more efficiency, and better durability starts with Gantner Instruments at Automotive Testing Expo India 2023.

From April 18-20, India’s largest automotive test and development show will be at the Chennai Trade Centre Complex in Chennai, India!

Your Golden Ticket to Interact with Our Equipment

We will showcase the three key building blocks of our Data Acquisition Solution in our Automotive Testing Expo booth. Our equipment will be running, allowing you to interact with it for a greater experience.

Q.series X – Data Acquisition Hardware

- Gantner’s data acquisition modules provide accurate signal conditioning for a wide range of sensor types, supporting both conventional electrical sensors and fiber optic sensors.

GI.bench – Data Acquisition Software

- GI.bench is a state-of-the-art data acquisition software environment combining system setup and configuration and logging and monitoring multiple data streams in one easy-to-use desktop application.

GI.connectivity – Open and Flexible Interfaces

- GI.connectivity provides safe and reliable data exchange and interoperability through various read/write interfaces at the controller, PC, and cloud levels. GI.connectivity will transform your Q.series X system into the most open and flexible data acquisition and streaming platform.

Don’t miss our innovations!

Visit us at Booth 3115! We are happy to work with you to find the best data acquisition solution for your requirements.

Contact for appointments

Rajaram T R
Country Head – India
raj@gantnerinstruments.in

We are looking forward to meeting you at Booth 3115. Don’t hesitate to contact us to schedule a meeting in advance.

Products & Services

Q.series X A156

New 4-channel carrier frequency amplifier for inductive transducers and strain gages

Events

Birchwood Engineering & Technology Solutions Exhibition 2023

GI Systems will be showcasing Gantner Instruments proven solutions provided in nuclear data acquisition and condition monitoring applications.

News

Model-Based Software Development with test.con

Enhancing Test Automation with Domain-Specific Modeling

Tips & TrendsProducts & Services

Top 3 product highlights of the new Q.series X for data acquisition

We think power and flexibility matter. And more power and more flexibility are even better. That’s why we put all our effort into developing more effective solutions for all advanced data acquisition tasks ahead of you. The extended edition of the Q.series offers powerful signal conditioning, higher ADC and data rates and you can even re-configure during operation.