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Meet us at The Battery Show North America 2025!
Events | < 1 minute Reading Time |

Meet us at The Battery Show North America 2025!

Visit us at Booth 2441 from October 6 to 9, 2025, at Huntington Place, Detroit, MI.

Explore our advanced battery testing solutions, including our high-voltage DAQ systems with 1500 VDC isolation, Electrochemical Impedance Spectroscopy(EIS) for detailed battery diagnostics, and precision Power Analyzers for comprehensive EV and inverter testing.

See firsthand how our modular, scalable, and accurate measurement technology can enhance your battery development and testing processes.

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News

Q.bloxx A105 CR Cryo Module with Extended Range

Cryo Technology is a rapidly growing market and therefore more and more new sensor kinds appear. A clear trend is that these cryogenic temperature sensors move to higher resistance. With Gantner’s cryo module – the Q.bloxx A105 CR – a measurement range of up to 25kohms is now possible. The module is available as standard DIN rail module, or as Q.brixx/Q.raxx with 4 times 4-pole-LEMO (ERA.1S.304.CLL).

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News

Science Brunch – IPERMON

On the 8th of October the climate and energy fund invites Gantner Instruments Vice President Jürgen Sutterlüti to present the project IPERMON at the science brunch in Vienna.

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News

Gantner Instruments presents cryogenic measurement solution at Space Tech Expo

From October 24 -26 the Space Tech Expo and Conference took place in Bremen, Germany. The Space Tech is Europe’s meeting place for space business, Technology and innovation.

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Tips & Trends

EtherCAT performance combined with industry leading DAQ: 5 benefits you’re missing out on

We have compiled a list of the 5 most significant benefits of using an EtherCAT-based data acquisition system. If you’re not already familiar with EtherCAT, prepare to be enlightened. If you’re among the many engineers that use EtherCAT in your testing lab then you can consider this a confirmation of why you do what you do – and an excellent place to direct those who still think Industrial Ethernet is not suitable for high-performance testing applications.

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