Newsletter 04/2008
With this issue we are pleased to invite you to meet us at one of these fairs:
SENSOR + TEST in Nuremberg, the worldwide largest event in the branches sensor and measuring technology
6, 7, 8 May 2008
Hall 9, Booth 471
Testing Expo in Stuttgart, the annual event in Automotive Testing
6, 7, 8 May 2008
Hall 1, Booth 1860
At both exhibitions we present technical trends in the field of remote measuring and I/O systems. Let us show you our latest developments and talk about your applications to provide you an individually solution.
News from the e.series
- New Test Controller completing the family:
While the existing versions providing Ethernet and Profibus-DP the new Test Controller offer the field bus interfaces EtherCAT and CANopen
- Test Controller e.pac DL:
This Logging version offer an internal memory for 32 Mio measurements that can be extended via an external HDD via USB in an almost infinitive way.
- CAN Communication Module D3 CAN:
Implementation of CAN components and device from the process level into an e.series system.
- Fast Multifunctional Module e.bloxx A2:
Voltage, current, ICP sensors and strain gauge half and full bridges measure with a 5 kHz sampling rate, TEDS prepared
- Extended functionality with Digital Module e.bloxx D1:
Measuring or frequency and duty cycle at PWM signals Time measurement via digital I/OS from 1 µs to 16 s
THE NEW
Concept Premiere:
he future bench mark for distributed systems in the field of measuring and testing. Don't miss it.
